Untangling Coupled Order Parameters at Complex Oxide Interfaces with Aberration-Corrected STEM and EELS

A.Y. Borisevich,Y. Kim,M.P. Oxley,S.J. Pennycook,S.V. Kalinin,A. Morozovska,E. Eliseev,Y. Chu,P. Yu
DOI: https://doi.org/10.1017/s1431927612003443
IF: 4.0991
2012-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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