Abstract:By analogy with ferromagnetism and the hysteresis of the magnetic moment with a magnetic field, materials that exhibit a macroscopic spontaneous polarization Ps, which can be reversed under electric field E were defined as ferroelectrics. Ps, the directional order parameter can give rise to different polar structural phase transitions and finally disappear as a function of temperature T and/or hydrostatic pressure P in a transformation from a non-centrosymmetric to a centrosymmetric space group. The physical properties of ferroelectric materials are the basis of many technological applications based on their hysteretic properties (Ps / E in ferroelectric random access memories) or based on their coupled properties (η (mechanical strain)/ E in piezoelectric applications). In order to understand the origin and the mechanisms associated with the ferroelectric properties, "in-situ" structural studies as a function of E, T and P have to be performed. In addition ferroelectric materials exhibit based on their directional properties (Ps) a particular domain configuration which makes the structural understanding of these compounds much more complex. Different scales should be taken into account: from the atomic scale (individual polar displacements) to the macroscopic scale (macroscopic piezoelectric effect) and finally the mesoscopic scale in between, which is governed by the domain wall motion. High piezoelectric/ferroelectric properties in lead perovskite materials (PZT, PMN, PZN) are structurally linked to strong disorder which can be characterized by the presence of diffuse scattering in diffraction experiments and by nanosized domains. Here we will present "in-situ" characterization in lead perovskite materials as a function of the applied electric field based on X-ray and neutron diffraction and EXAFS techniques. A brief overview of the challenges to solve in future studies as a function of pressure and temperature will also be discussed.

IN SITUINVESTIGATION OF RETENTION PROPERTIES OF POLYDOMAIN FERROELECTRIC THIN FILMS BY MULTIMODE SCANNING FORCE MICROSCOPY

Piezoresponse Force Microscopy Studies on the Domain Structures and Local Switching Behavior of Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals

Domain Switching Dynamics for ImClO4 Molecular Ferroelectric Thin Films

Piezoresponse Force Microscopy Study on Ferroelectric Polarization of Ferroelectric Polymer Thin Films with Various Structural Configurations

Watching domains grow: In-situ studies of polarization switching by combined scanning probe and scanning transmission electron microscopy

Flexoelectricity-induced Retention Failure in Ferroelectric Films

PFM Study of the 90 Degrees Step-by-Step Domain Switching and the Temperature Effect in 0.8Pbtio(3)-0.2Bi(mg0.5ti0.5)o-3 Ferroelectric Thin Film

Domain configuration and interface structure analysis of sol-gel-derived PZT ferroelectric thin films

Ferroelectric and Ferroelastic Domain Related Formation and Influential Mechanisms of Vapor Deposited Piezoelectric Thin Films

Self-Organized Ferroelastic Superdomains with Enhanced Piezoresponse in (101)-Oriented Pb(Zr 0.2 ,Ti 0.8 )O 3 Thin Films

Local Probing of the Non-Uniform Distribution of Ferrielectric and Antiferroelectric Phases

Probing the Giant Piezoelectric response of ferroelectric perovskites

Studying the Polarization Switching in Polycrystalline BiFeO3 Films by 2D Piezoresponse Force Microscopy

Thickness-dependent Evolution of Piezoresponses and A/c Domains in [101]-Oriented PbTiO3 Ferroelectric Films

Direct Observation of the Domain Kinetics During Polarization Reversal of Tetragonal PMN-PT Crystal

Thickness-Dependent Polar Domain Evolution in Strained, Ultrathin PbTiO3 Films

Domain Growth Dynamics in PMN-PT Ferroelectric Thin Films

Fingerprints of relaxor ferroelectrics: Characteristic hierarchical domain configurations and quantitative performances

Investigation of the Ferroelectric Domain of PZT Ceramic

Domain Evolution In Ferroelectric Thin Films During Fatigue Process

Evolution of domain structure in epitaxial ferroelectric films grown by metal-organic vapor-phase epitaxy