In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials

Songhua Cai,Miao Wang,Xiaoqing Pan,J. Joshua Yang,Feng Miao,Peng Wang
DOI: https://doi.org/10.1017/s1431927618009911
IF: 4.0991
2018-01-01
Microscopy and Microanalysis
Abstract:1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 3. Department of Chemical Engineering and Materials Science and Department of Physics and Astronomy, University of California, Irvine, CA, USA. 4. Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, USA.
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