In-situ Switching of a Ferroelectric Film Through a Non-ferroelectric Layer and Direct Scanning Probe Analysis of the Same Cross Section

J.R. Jokisaari,P. Gao,X.Q. Pan
DOI: https://doi.org/10.1017/s1431927614010022
IF: 4.0991
2014-01-01
Microscopy and Microanalysis
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