An in Situ TEM Study of Ferroelastic Domain Mobility
P. Gao,J. Jokisaari,C. Nelson,S.-H. Baek,M. Trassin,C.W. Bark,R. Ramesh,C.-B. Eom,X. Pan
DOI: https://doi.org/10.1017/s1431927613009495
IF: 4.0991
2013-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.