In Situ TEM Observation of Domain Nucleation and Domain Wall-Defect Interactions in Bismuth Ferrite Under Applied DC Bias

CR Winkler,LW Martin,CL Johnson,ML Taheri
DOI: https://doi.org/10.1017/s1431927610060782
IF: 4.0991
2010-07-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
materials science, multidisciplinary,microscopy
What problem does this paper attempt to address?