Carrier Concentration Dependence Of Acceptor Activation Energy In P-Type Zno

olena lopatiuktirpak,w v schoenfeld,leonid chernyak,f x xiu,j l liu,seaug jang,f ren,s j pearton,a osinsky,paul chow
DOI: https://doi.org/10.1063/1.2206700
IF: 4
2006-01-01
Applied Physics Letters
Abstract:The characteristics of an acceptor level in Sb-doped, p-type ZnO were studied using cathodoluminescence (CL) spectroscopy as a function of hole concentration. Variable-temperature CL measurements allowed us to estimate the activation energy of an Sb-related acceptor from temperature-induced decay of CL intensity. The values of activation energy of about 212 +/- 28, 175 +/- 20, 158 +/- 22, and 135 +/- 15 meV were obtained for samples with carrier concentrations of 1.3x10(17), 6.0x10(17), 8.2x10(17), and 1.3x10(18) cm(-3), respectively. The involvement of acceptor levels is supported by the temperature-dependent hole concentration measurements. The possible origins of the strong temperature dependence are discussed. (c) 2006 American Institute of Physics.
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