Correlation Between Carrier Recombination and P-Type Doping in P Monodoped and In–P Codoped ZnO Epilayers

J. D. Ye,S. L. Gu,F. Li,S. M. Zhu,R. Zhang,Y. Shi,Y. D. Zheng,X. W. Sun,G. Q. Lo,D. L. Kwong
DOI: https://doi.org/10.1063/1.2722204
IF: 4
2007-01-01
Applied Physics Letters
Abstract:The carrier recombination processes in p-type ZnO epilayers with P monodoping and In–P codoping have been studied by temperature-dependent photoluminescence spectroscopy. Good correlations were observed between carrier recombination and acceptor and donor energy levels. The exciton transition feature of acceptor-bound excitons (3.350eV), the free electron-acceptor emission (3.315eV), and the donor-acceptor-pair emission (3.246eV) exhibited different carrier recombination associated various defect complexes. The origins of two broad emissions at ∼2.99 and ∼2.89eV were found to be due to different photoelectron radiative transitions associated with deep level acceptors (isolated Zn vacancies). The acceptor-bound energies for P monodoped and In–P codoped epilayers ∼195 and ∼127meV, respectively. The small binding energy is helpful for acceptor ionization at room temperature, resulting in a high hole concentration in the codoped epilayer.
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