Breakthrough of the P-Type Doping Bottleneck in Zno by Inserting an Ultrathin Znx (X = S, Se and Te) Layer Doped with N-X or Ag-Zn
Xin-he Jiang,Jun-jie Shi,Min Zhang,Hong-xia Zhong,Pu Huang,Yi-min Ding,Xiong Cao,Meng Wu,Zhi-min Liao
DOI: https://doi.org/10.1088/0022-3727/49/9/095104
2016-01-01
Abstract:The worldwide problem of p-type doping in ZnO is investigated based on first-principles calculations by combining the standard density functional theory and hybrid functional methods. We find that p-type doping can be realized by inserting an ultrathin ZnX (X = S, Se and Te) layer, doped with N-X or Ag-Zn, into ZnO to form short-period (ZnO)(m)/(ZnX)(n) (m > n) superlattices. The formation energy is the lowest for NX or AgZn in the ZnX layer. The Zn-rich (Zn-poor) condition is favourable for the formation of the NX (AgZn) defect. Compensation by the native defects can be avoided for the Ag-doped (ZnO) m/(ZnX) n under the Zn-poor condition. The N (Ag) acceptor activation energy can be reduced from 0.45 (0.43) eV in ZnO to 0.33 (0.32) eV in (ZnO)(5)/(ZnS)(1), 0.20 (0.24) eV in (ZnO)(5)/(ZnSe)(1) and 0.12 (0.13) eV in (ZnO)(5)/(ZnTe)(1), which is caused by the ZnX-monolayer modulation to the local structure around the NX or AgZn defect and the high-lying p-derived valence bands. Moreover, the band gaps can be tuned from 3.40 eV of ZnO to 3.21 eV of (ZnO)(5)/(ZnS)(1), 2.41 eV of (ZnO)(5)/ (ZnSe)(1) and 2.26 eV of (ZnO)(5)/(ZnTe)(1), which is promising for the integration of ZnO-based white light-emitting diodes.