Epitaxially Grown Graphene Field-Effect Transistors with Electron Mobility Exceeding 1500 Cm2/vs and Hole Mobility Exceeding 3400 Cm2/vs

Yanqing Wu,Peide D. Ye,Mchael A. Capano,Tian Shen,Yi Xuan,Yang Sui,Minghao Qi,James A. Cooper
DOI: https://doi.org/10.1109/isdrs.2007.4422514
2007-01-01
Abstract:In this paper, we report, for the first time, the observation of n-type and p-type transition on epitaxially grown graphene films by top-gate bias. More importantly, the measured electron and hole mobility on fabricated top-gate graphene field-effect transistors exceeds 1500 cm2/Vs and 3400 cm2/Vs, respectively.
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