Direct Extraction of Carrier Mobility in Graphene Field-Effect Transistor Using Current-Voltage and Capacitance-Voltage Measurements

Zhiyong Zhang,Huilong Xu,Hua Zhong,Lian-Mao Peng
DOI: https://doi.org/10.1063/1.4768690
IF: 4
2012-01-01
Applied Physics Letters
Abstract:Top gated graphene field-effect transistors were fabricated using yttrium oxide film as high-κ gate dielectric, and the gate voltage dependent drain current and gate capacitance characteristics were both measured on one graphene device. Based on the two kinds of data sets, we developed a method to extract the carrier mobility of graphene field-effect transistors, along with some other parameters, such as series resistance and residual carrier density. Prior to previous method, this method could well fit the transfer curve of graphene field-effect transistor with high gate oxide capacitance since its carrier concentration is directly obtained from the experimental data rather than from analytic equation.
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