Electrothermal Characterization of TFTs under the Impact of an EMP

Rong-Rong Xu,Wen-Yan Yin,Jun-Fa Mao
DOI: https://doi.org/10.1109/apemc.2008.4559988
2008-01-01
Abstract:This paper is focused on electrothermal characterization of n-channel polysilicon thin-film transistors (TFTs) under the impact of an EMP. The mathematical treatment is based on hybrid time-domain finite element method (FEM), in which non-linear temperature-dependent characteristics of electrical conductivity and thermal conductivity of all materials involved are treated appropriately, and therefore, the time-dependent electronic field, current density, and temperature rise in TFTs are captured successfully and compared for different cases.
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