Numerical investigation on thermal characteristics of BJTs under the impact of an EMP

RongRong Xu,Wenyan Yin,Junfa Mao
DOI: https://doi.org/10.1109/APMC.2007.4554916
2007-01-01
Abstract:Transient thermal analysis of a bipolar junction transistor (BJT) is carried out in this paper, with the hybrid finite element method (FEM) employed. The distribution and variation of the electronic field, current density, and temperature in the transistor under the impact of an electromagnetic pulse (EMP) are characterized numerically.
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