Preparation of noncrystalline silicon carbon films by using heavily hydrogen diluted silane and ethene

WeiQiang Han,Gaorong Han,Donglin Nie,ZiShang Ding
1996-01-01
Abstract:The nanocrystalline silicon carbon films were prepared by using RF glow discharge of heavily H2 diluted SiH4 and C2H4 through plasma enhanced chemical vapor deposition. The effect of gas volume ratio of (C2H4+SiH4) H2(Xg) on the film structure, electric and optical properties was studied. It was found that (1) when the Xg increases from 2% to 5%, owing to the decrease of hydrogen etching effect, the volume fraction of the crystalline phase decreases from 48% to 8%, and in the meanwhile, the average crystallite size varies from 3.5nm to 9nm; (2) when Xg��6%, the deposition films are amorphous silicon carbon films; (3) the electrical conductivity of nc-SiCx: H films is of percolation behavior that correlates with the volume fraction of the crystalline phase. Besides, the growth mechanism and crystalline process were also discussed here in detail.
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