Improved N–Al Codoped P-Type ZnO Thin Films by Introduction of a Homo-Buffer Layer

JG Lu,LP Zhu,ZZ Ye,YJ Zeng,F Zhuge,BH Zhao,DW Ma
DOI: https://doi.org/10.1016/j.jcrysgro.2004.10.019
IF: 1.8
2005-01-01
Journal of Crystal Growth
Abstract:p-type ZnO thin films have been realized by a N–Al codoping method. The influence of homo-buffer layer on film properties was studied in this work. The buffer layer was deposited at a high temperature of 600°C, and the desired codoped film was successively formed at 500°C on the first template layer. The N–Al codoped ZnO film was improved evidently in its crystal quality, optical quality and p-type conduction by adopting a homo-buffer layer. Hall measurements revealed that the p-type film had a low resistivity around 8.20Ωcm. The decrease in resistivity comes from a large increase of mobility (from 0.43 to 2.06cm2V−1s) and a slight increase of carrier concentration (typically about 1017cm−3). Introduction of a homo-buffer layer is a promising approach to realize p-type ZnO.
What problem does this paper attempt to address?