Phase-separation Suppression in GaN-rich Side of GaNP Alloys Grown by Metal–organic Chemical Vapor Deposition

D.J. Chen,B. Shen,Z.X. Bi,K.X. Zhang,S.L. Gu,R. Zhang,Y. Shi,Y.D. Zheng,X.H. Sun,S.K. Wan,Z.G. Wang
DOI: https://doi.org/10.1007/s00339-003-2186-5
2005-01-01
Applied Physics A
Abstract:The GaN-rich side of GaNP ternary alloys has been successfully synthesized by light-radiation heating and low-pressure metal–organic chemical vapor deposition. X-ray diffraction (XRD) rocking curves show that the (0002) peak of GaNP shifts to a smaller angle with increasing P content. From the GaNP photoluminescence (PL) spectra, the red shifts from the band-edge emission of GaN are determined to be 73, 78 and 100 meV, respectively, in the GaNP alloys with the P contents of 1.5%, 5.5% and 7.5%. No PL peak or XRD peak related to GaP is observed, indicating that phase separation induced by the short-range distribution of GaP-rich regions in the GaNP layer has been effectively suppressed. The phase-separation suppression in the GaNP layer is associated with the high growth rate and the quick cooling rate under the given growth conditions, which can efficiently restrain the accumulation of P atoms in the GaNP layer.
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