Abstract:In the present study, we investigate the structural, morphological and magnetic properties of sol–gel spin-coated PZT thin films on alumina substrate. The morphotropic phase boundary (MPB) of PZT [Pb (Zr1−xTix)03] between the tetragonal and rhombohedral phases occurs at the Zr/Ti ratio of 52/48. At the MPB the physical properties of PZT are of far-reaching importance due to their possible crystalline phases. In this study Pb(Zr0.52Ti0.48)03 sols are prepared at room temperature and at 125 °C. The gels are coated onto alumina substrate using a spin-coating unit as two and three layers. The structural studies using XRD confirm the perovskite phase formation at an annealing temperature of 660 °C for both films. The structural parameter grain size, dislocation density, lattice parameters and strain were dependent on the sol temperature. The SEM morphology of the samples represents well-developed dense grain structure and thickness in micrometer ranges. The VSM analysis shows diamagnetic and ferromagnetic hysteresis loop. The ferromagnetism at low fields in PZT films is confirmed by studying the magnetic properties of powder made of the same gel. The effect of heat treatment on the gel preparation is observed on structural, morphological and magnetic properties of PZT thin films. The ferromagnetism in PZT can be attributed to oxygen vacancies. The squareness ratio of the films shows the application of the films as a high-density recording medium.

Effect of pyrolysis temperature on preferential orientation and electrical properties of sol-gel derived lead zirconate titanate films

Preparation of PZT Thick Film by a High Speed Sol-gel Method

Preferred orientation controlling of PZT (52–48) thin films prepared by sol–gel process

Sol–gel Synthesis of 0.94(bi0.5na0.5)tio3–0.06batio3 Lead-Free Piezoelectric Films: Effect of Pyrolysis Temperature on Phase Evolution and Electrical Properties

Phase compositions and ferroelectric properties of Pb(Zr0.52,Ti0.48)O3 thin films with different highly orientations prepared by a sol–gel route

Enhanced Ferroelectric Properties of Highly (100) Oriented Pb(Zr0.52ti0.48)O-3 Thick Films Prepared by Chemical Solution Deposition

Combined Effect of Preferential Orientation and Zr/Ti Atomic Ratio on Electrical Properties of Pb(ZrxTi1−x)O3 Thin Films

Effectof annealing temperature onthe propertiesof PZTferroelectric thinfilms inthe processof RTPwithSol-gel method

Low Temperature Preparation and Electric Properties of Highly (100)-Oriented Pb0.8 La0.1Ca0.1Ti0.975O3 Thin Films Prepared by a Sol–gel Route

Structure and Electrical Properties of Rapid Thermally Annealed PZT Films Deposited Through Sol-Gel Process

Growth and ferroelectric properties of sol-gel derived Pb(Zr,Ti)O3 using inorganic zirconium precursor

Microstructure and Electrical Properties of Lead Zirconate Titanate Thin Films Deposited by Sol-Gel Method on La 0.7 Sr 0.3 MnO 3 /sio 2 /si Substrate

Effect Of Annealing Temperature On Properties Of Sputtered Pzt Thin Films

Crystallization Behaviors and Electric Properties of (pb0.8ca0.2)tio3 Thin Films Prepared by a Sol–gel Route

Effect of Annealing Temperature on Ferroelectric Electron Emission of Sol–gel PZT Films

Effects of annealing temperature on structure and electrical properties of sol–gel derived 0.65PMN-0.35PT thin film

A Facile Hot Plate Annealing at Low Temperature of Pb(Zr0.52Ti0.48)O3 Thin Films by Sol–gel Method and Their Ferroelectric Properties

Synthesis and characterization of nanocrystalline PZT powders by a simple sol-gel method

Effect of sol temperature on structural, morphological and magnetic properties of PZT thin films on alumina substrate

Improved electrical properties in PZT/PZ thin films by adjusting annealing temperature

Growth and Characterization of Lead Zirconate Titanate (PZT) Thin Films