Dimension Measurement Based on MEMS Micro Tactile Probe and Nanomeasuring Machine

李源,邹子英,傅云霞,傅星,栗大超,胡小唐
DOI: https://doi.org/10.3969/j.issn.1004-1699.2008.12.029
2008-01-01
Abstract:According to dimension measurement requirement of micro structure,a measurement system combined by MEMS micro tactile probe and nanomeasuring machine is constructed.On basis of performance verification of probe's output,a series of tests are done.The standard deviations of measurement in same vertical,same transverse direction,and opposite transverse direction are 41.755 2 nm,6.05 μm,6.16 μm separately.The standard deviation of difference between trace and retrace in scanning test is 23.088 nm.
What problem does this paper attempt to address?