Nanoscale Measurement Technique of In-Plane Motion for MEMS Based on Correlation Fitting Calibration Method

陈治,胡晓东,傅星,胡小唐
DOI: https://doi.org/10.3969/j.issn.0493-2137.2009.06.015
2009-01-01
Abstract:Motion measurement is a key to get characteristics and dynamic parameters of micro-electro-mechanical system(MEMS) resonator in every moment.The results of measurement give important reference to MEMS design.A completely novel calibration subpixel motion measurement algorithm based on phase correlation method was derived,through which not only the error of phase correlation can be calibrated and compensated,but also the resolving power was improved to nano-scale.MEMS motion process was analyzed using the algorithm to get the amplitude-phase curve of MEMS in special driving frequency.The phase-frequency character was also analyzed,and the amplitude-frequency curve was acquired through sweep frequency measurement.Experimental results indicate that the method has a good measurement precision and the resolving power of measurement is less than 5.nm.
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