Full Field 3D Rebuilding Method in Dynamic MEMS Characterization

GUO Tong,HU Chun-guang,HU Xiao-dong,LI Da-chao,FU Xing,HU Xiao-tang
DOI: https://doi.org/10.3969/j.issn.1003-501x.2006.09.017
2006-01-01
Abstract:A key purpose for testing Microelectromechanical systems (MEMS) is to provide data feedback of measurements to the design and simulation in the process of development, where high-speed visualization of dynamic properties of MEMS devices is a very important aspect. This paper describes a computer-controlled stroboscopic interferometer system for measuring out-of-plane motions of MEMS structures with nanometer resolution. In the out-of-plane motion measurement of MEMS, a two-direction phase-unwrapping method based on time axis and space axis is demonstrated. And the time and space information of MEMS motions are combined in favor of analyzing MEMS dynamic behaviors. In addition, 3D motions of MEMS devices can be measured by using the full field rebuilding technology based on mask.
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