Stroboscopic Interferometer for Dynamic MEMS Characterization

郭彤,胡春光,胡晓东,栗大超,金翠云,傅星,胡小唐
DOI: https://doi.org/10.3969/j.issn.1672-6030.2004.04.010
2004-01-01
Abstract:A key purpose for testing MEMS i s to provide data feedback of measurements to the design and simulation in t he process of development, where high-speed visualization of dynamic propertie s of MEMS devices is a very important aspect. This paper describes a computer- controlled stroboscopic interferometer system for measuring out-of-plane m otions of MEMS structures with nanometer resolution. The system uses a modified phase-shifting interferometric algorithm and a pulsed laser diode(LD) serves as the stroboscopic light source, permitting measurement of large-amplitude out- of-plane motions(above ten micrometers) below 1 MHz. The high out-of-plane se nsitivity of the method makes it particularly suitable for characterizing microm echanical (optical) elements. This paper illustrates the capabilities of the sy stem with a study of the dynamic behavior of a polysilicon micro-resonator.
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