Rapid Measuring Method of Micro-Motion Based on Time-Averaged Microscopic Interferometry

Tong Guo,Chunguang Hu,Jinping Chen,Xing Fu,Xiaotang Hu
DOI: https://doi.org/10.1115/mnc2007-21020
2007-01-01
Abstract:An optical measurement system and method for out-of-plane motion testing of micro-structures is presented. Based on a Mirau type microscopic interferometer, the system adopts time-averaged interferometry to realize the measurement of the out-of-plane dynamic properties of movable micro-structures. For mapping the zero-order Bessel function modulating the contrast of two-beam interference fringes, a four-step phase-shift technique is applied. An experiment on a micro-resonator demonstrates that out-of-plane motion can be measured at any frequency with a lateral resolution in the micrometer range and a detection limit around 5nm.
What problem does this paper attempt to address?