A Structured Illumination Microscope with the Combination of Optical Sectioning and Lateral Resolution Enhancement for Precise 3D Industrial Metrology
Jong-Kyu Park,Min Seo Cho,Ki-Nam Joo
DOI: https://doi.org/10.1007/s12541-024-01164-8
IF: 2.0411
2024-11-03
International Journal of Precision Engineering and Manufacturing
Abstract:In this investigation, we suggest the combination of the optical sectioning technique and the spatial frequency synthesis method to realize a precise 3D structured illumination microscopy with the high lateral and axial resolutions. By spatial frequency synthesis method, the spatial frequency content is further extended than that of the typical microscope, and the reconstructed images are used for optical sectioning for 3D surface profile measurements. Based on the theoretical approach, the proposed method was experimentally verified, and the modulation transfer function of the reconstructed images was compared to the original ones. Then, the final 3D measurement results were provided by the combined operation of the SIM. As the result, the instrument transfer function was improved 1.4 times for the line pattern specimens with 50 μm, 20 μm, 10 μm and 3 μm pitches and 1 μm step height.
engineering, mechanical, manufacturing