Near Common-Path Optical Fiber Interferometer for Potentially Fast On-Line Microscale-Nanoscale Surface Measurement

Xiangqian Jiang,Kaiwei Wang,Haydn Martin
DOI: https://doi.org/10.1364/ol.31.003603
2007-01-01
SPIE Newsroom
Abstract:We introduce a new surface measurement method for potential online application. Compared with our previous research, the new design is a significant improvement. It also features high stability because it uses a near common-path configuration. The method should be of great benefit to advanced manufacturing, especially for quality and process control in ultraprecision manufacturing and on the production line. Proof-of-concept experiments have been successfully conducted by measuring the system repeatability and the displacements of a mirror surface.
What problem does this paper attempt to address?