Design and study on a nanometer order accuracy optical-path-splitting two-frequency interferometer measuration system

GE Yang-xiang,WANG Dong-sheng,LI Yu-he,LI Qing-xiang
DOI: https://doi.org/10.3321/j.issn:1002-1582.2006.05.001
2006-01-01
Optical Technique
Abstract:In order to implementation of the quick and exact surface topography detection,a novel nanometer order accuracy optical-path-splitting two-frequency interferometer measuration system was developed.The system comprises low frequency-difference two-frequency laser interferometer measuration module,micro-detection device and two dimension platform.The microprobe,approaching example surface in tap mode until several tens nanometers to surface,generates inclination because of atom force.Two-frequency interferometer module was utilized to measure longitudinal inclination.The system measured the example in honeycomb mode in order to obtain surface topography.The Two-frequency interferometer measuration theory was improved according to laser source in reality.After all,the system was put up.The experiment is actualized to verify the system performance.The experimental results show that the device has the accuracy of nanometer order,satisfies performance requirements for the superfinish surface topography detection.
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