A Measurement System for the Roughness of Ultra Smooth Surface with Large Aperture

Yongrong Yang
2004-01-01
Abstract:The described optical system,which is used to measure the roughness of ultra smooth surface,forms a common-path interference,so a nondestructive detection can be carried out by it without standard reference plane.In consequence of the way that the optical interference sensor is moved rather than the specimen while measuring,the system can be used to measure the optical component in great dimension.The lateral resolution of measurement system is 0.5μm,and the vertical one is 0.1nm.The repeatability of the system is better than 2%.
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