Roughness Characterization of Well-Polished Surfaces by Measurements of Light Scattering Distribution

ZR Zheng,ZP Yu,XT Sun,J Zhou,PF Gu
IF: 0.6
2010-01-01
Optica Applicata
Abstract:Light scattering from micro-rough surface is discussed firstly in this paper, then the relationship of BRDF(Bidirectional Reflectance Distribution Function) of light scattering from micro-rough surface with TIS(Total Integrated Scattering) is analyzed. Moreover, roughness statistical characterization such as RMS(Root Mean Square roughness), PSD(Power Spectral Density function) are deduced by TIS(total integrated scattering) of polished surface. And, an automatic measure system of light scattering with one dimensional scanning method is introduced, the layout of system and optical sub-system are illuminated. Based on the light scattering measurements system, BRDF of two kind of polished surfaces (silica surface and Ag reflector) have been tested, and PSD of two surfaces have been given by light scattering measurements, roughness characterization of two surfaces have been compared with the tested data by profile mete. Result shows that light scattering measurement method has high precision on nondestructive measurement for polishing surfaces.
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