Fast measurement spherical surface and fast patching up aspherical surface

Tianning Cao,Weimin Zheng,Jian Bai,Shuwen Zhou
1998-01-01
Guangxue Jishu/Optical Technique
Abstract:A new upright shop digital spherical wave interferometer was designed. By using the comparison method, once the interferometer is adjusted, it can fast measure many identical aspheric surfaces without any more complex adjustments, and the fringes can be displayed on the monitor screen. And by a using the fringe scanning technique, the ring number N and the local ring number δN will be determined automatically and objectively. Then a using the Aspherics Characteristics Interferogram, the low gradient aspherics can be patched up rapidly initially, then the whole surface is patched up by detecting the phase of each sub aperture. The figure error of the aspherics can also be achieved by aspherical wavefront subtract.
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