An Optical Probe Stage and Its Applications in Mechanical Behavior Measurements of Micro-Objects and Thin Films

Xide Li,Yan Yang
DOI: https://doi.org/10.1088/0960-1317/16/9/020
2006-01-01
Journal of Micromechanics and Microengineering
Abstract:The rapid development of a wide variety of new devices in microelectronics, sensors, MEMS and NEMS has led to new challenges in characterizing their mechanical behavior and assessing their reliability. Static and dynamic mechanical behavior measurement of micro-objects and low-dimension films has become a key issue. In this paper, an optical probe stage has been proposed to test the deformation of micro-objects. The technique is based on optical interferometry and actuator-driven cantilever/plate deformed probes. In the proposed apparatus, a monochromatic object light is used to illuminate the deformed probes and measured micro-objects. The interference fringe pattern related to deformations of deflections of the probes and the micro-objects was analyzed to obtain the loading forces exerted by the probes and the deformations of micro-objects. Properties of static and dynamic deformations of different kinds of probes were investigated and the optical probe stage was applied in deformation measurement, microforce testing and bonded wire fatigue analysis of a metal-oxide semiconductor chip.
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