Curvature Measurement of Micro Cantilever Based on Phase-Stepping Microscopic Interferometry

HUANG Yu-bo,LI Da-chao,HU Xiao-tang,FU Xing,ZHANG Wen-dong,HU Chun-guang
DOI: https://doi.org/10.3321/j.issn:1004-924x.2007.09.015
2007-01-01
Optics and Precision Engineering
Abstract:A curvature measurement method based on microscopic interferometry and finite difference method is proposed to extract the curvature of micro cantilevers accurately.In comparison of the measured vertical height data obtained via microscopic interferometry with the modeled data from finite difference method,the best fitted value of curvature is obtained employing quasiNewton search algorithm or least square method.The experimental results show that precise curvature value can be obtained within rms 1.5 nm,and if measurement is not taken at the actual beginning of the beam but with pixels of offset in the direction of the beam length,the result of curvature is hardly influenced.Experimental results also show the method is very practical in MEMS measurement of residual stress and stress gradient using microscopic interferometry to provide high resolution and accuracy and nonzero boundary condition to refine the beam model.
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