Photoluminescence During the Crystallization of A-Si∶h/sio2 Multilayers

Zhongyuan Ma,Han Pei-Gao,Wei Li,San Chen,Bo Qian,Jingdong Xu,Xu Ling,Huang Xin-Fan,Kunji Chen,D. L. Feng
2006-01-01
Abstract:a-Si∶H/SiO2 multilayers with different thickness of a-Si∶H were layer by layer deposited and in situ plasma oxidized by plasma enhanced chemical vapor deposition system.Size-controlled nc-Si/SiO2 multilayers were obtained through step-by-step thermal annealing of a-Si∶H/SiO2 multilayers including dehydrogenation,rapid thermal annealing,quasi-static annealing.The change of photoluminescence from a-Si∶H/SiO2 to nc-Si/SiO2 was traced through step-by-step post-treatment combined with Raman,FTIR and TEM.The origin of the change of photoluminescence at different stage of thermal annealing is investigated.The relation between the change of photoluminescence and microstructure of the samples is discussed in detail.
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