Fabrication of Nanoslits with <111> Etching TSWE Method

Hao Hong,Li Ye,Ke Li,Pasqualina M. Sarro,Guoqi Zhang,Zewen Liu
DOI: https://doi.org/10.1109/NEMS51815.2021.9451489
2021-01-01
Abstract:In this paper, we report a modified three step anisotropic wet etching (TSWE) method to fabricate solid-state silicon nanoslits. The slit-opening process is performed by < 111 > crystal plane etching. The etching rate of the < 111 > crystal plane is reasonably slow as it is only 1/45 of the < 100 > etching rate, thus allowing and therefore good slits-opening controllability. By slowly etching the < 111 > crystal plane, the over-etching was effectively reduced. Perfectly rectangular nanoslits with different dimensions were successfully obtained. The smallest achieved feature size of the nanoslit is 8.3 nm.
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