Improved Metal-Semiconductor Contacts on Porous Silicon by Electroless Nickel Plating

Feng YU,Jiake LIAO,Yejun QU,Anran GUO,Wei LI
DOI: https://doi.org/10.3969/j.issn.1005-9490.2014.04.002
2014-01-01
Abstract:Porous silicon ( PS ) has emerged as a high optical sensitive material for making Si-photoelectronic detectors and photovoltaic solarcells. In order to improve the quality of metal-semiconductor contacts on PS, the porous silicon was fabricated by electrochemical etching technique, and the metal electrodes were plated by electroless nickel plating or deposited by physical vapor deposition( thermal evaporation and magnetron sputtering) . Experiments were performed to examine the morphologies and I-V characteristics of these contacts,and the role of the rapid annealing treatment on the quality of the contacts was also discussed. The results indicated that the metal-semiconductor contact plated by electroless nickel plating,with a rapid annealing treatment,performs an excellent ohmic behavior and gives a low specific contact resistance(10-1 Ω·cm2 ) .
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