Fabrication of High Growth Rate Solar-Cell-quality C-Si:H Thin Films by VHF-PECVD

Xd Zhang,Y Zhao,F Zhu,J Sun,Cc Wei,Gf Hou,Xh Geng,Sz Xiong
DOI: https://doi.org/10.1088/1009-1963/13/8/034
2004-01-01
Chinese Physics
Abstract:Several series of Si:H films were fabricated by the very high frequency plasma enhanced chemical vapour deposition (VHF-PECVD) at different substrate temperatures (T-s) and silane concentration (SC = [SiH4]/[SiH4+H-2]%). The results of Raman spectroscopy showed structural evolution of the Si:H films with the variation of T-s and, SC. The results of x-ray diffraction (XRD) measurements indicated that T-s also influences the crystal orientation of the Si:H films. The modulation effect of T-s on crystalline volume fraction (X-c) is more evident for the high SC, which shows different trend compared to low SC. In addition, the growth rate of the films also showed a regular change with the variation of SC and T-s. Different samples in the series showed a similar increase in dark conductivity and a decrease in photosensitivity with increasing T-s and decreasing SC. Device-quality microcrystalline silicon materials were deposited at a high growth rate, characterized by relatively low dark conductivity and relatively high photosensitivity in a certain crystalline range. The microcrystalline silicon solar cell with a conversion efficiency of 4.55% has been prepared by VHF-PECVD.
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