Abstract:Utilizing MgO single crystal substrates with varied orientations (〈100〉, 〈110〉 and 〈111〉), BiFe 0.91 Zr 0.09 O 3 ·(BFZO) films with diverse orientations were synthesized on LaNiO 3 ·(LNO) underlying electrodes employing the sol–gel technique, thereby establishing BFZO/LNO/MgO multilayer film configurations. This research comprehensively examines the impact of orientation on the crystal lattice, microstructure, defect density, and electrical characteristics of BFZO films. The outcomes reveal that the fabricated films demonstrate favorable epitaxial growth relationships and compact surface morphologies. X-ray photoelectron spectroscopy (XPS) analysis demonstrates that the films oriented along the 〈111〉 direction exhibit the least amount of Fe 2+ and oxygen vacancy defects. Moreover, these films show the highest remanent polarization (2 P r = 85.31 μC/cm 2 ), the lowest leakage current density, and exceptional resistance to aging. These findings suggest that the orientation of the films plays a crucial role in influencing their structural and electrical characteristics, thereby holding significant implications for enhancing the fabrication of functional films.

Structure and Electrical Properties of (100)-Oriented BiSc1/2Fe1/2O3–PbTiO3 Thin Films with Different Thickness Via Sol–gel Method

Effect of PbO seeding layers on the structure and properties of the sol-gel-derived BiScO3-PbTiO3 thin films

Investigation of Thickness Dependence of Structure and Electric Properties of Sol-Gel-Derived BiScO3-PbTiO3 Thin Films: Investigation of Properties of BiScO3-PbTiO3 Thin Films

Characterization of (100)-Oriented BiScO3–PbTiO3 Thin Films Synthesized by a Modified Sol-Gel Method

Investigation Of Thickness Dependence Of Structure And Electric Properties Of Sol-Gel-Derived Bisco3-Pbtio3 Thin Films

Fabrication and Characterization of High Curie Temperature BiSc1/2Fe1/2O3–PbTiO3 Piezoelectric Films by a Sol–gel Process

Fabrication and Properties of Sol–Gel‐Derived BiScO3–PbTiO3 Thin Films

Epitaxial Growth of Sol-Gel Derived BiScO3–PbTiO3 Thin Film on Nb-doped SrTiO3 Single Crystal Substrate

Characterization of (100)-Oriented 0.63bimg1/2ti1/2o3–0.37pbtio3 Piezoelectric Films by a Sol–gel Process

Enhanced Dielectric and Piezoelectric Properties of (100) Oriented Bi0.5Na0.5TiO3–BaTiO3–SrTiO3 Thin Films

Properties of Compositionally Graded BiScO3–PbTiO3Thin Films Fabricated by a Sol–Gel Process

Orientation Control in Sol–Gel‐Derived BiScO3–PbTiO3 Thin Films

Analysis for crystal structure of Bi(Fe,Sc)O3 thin films and their electrical properties

Manipulation of phase transitions and electrical properties of Ba<sub>1-x</sub>Sr<sub>x</sub>TiO<sub>3</sub> thin films through orientation engineering

Structural Changes and Ferroelectric Properties of BiFeO<sub>3</sub>-PbTiO<sub>3</sub> Thin Films Grown via a Chemical Multilayer Deposition Method

Dielectric Properties of Oriented PbZrO3 Thin Films Grown by Sol-Gel Process

Effect of substrate orientation on the structures and properties of BiFe0.91Zr0.09O3 thin films

Fabrication and Properties of Epitaxial Growth BiScO3–PbTiO3 Thin Film Via a Hydrothermal Method

Microstructure And Ferroelectric Properties Of Sol-Gel Derived Bi3.15nd0.85ti3o12 Thin Films On Pt/Ti/Sio2/Si(100)

Structure, Ferroelectric, and Enhanced Fatigue Properties in Sol-Gel Processed New Bi-Based Perovskite Thin Films of Bi(Cu 1/2 Ti 1/2 )O 3 -PbTiO 3

Structural, Dielectric and Piezoelectric Properties of (bi0.5na0.5)tio3–(bi0.5k0.5)tio3–bi(zn0.5ti0.5)o3 Thin Films Prepared by Sol–gel Method