Analysis for crystal structure of Bi(Fe,Sc)O3 thin films and their electrical properties

Shintaro Yasui,Hiroshi Uchida,Hiroshi Nakaki,Ken Nishida,Hiroshi Funakubo,Seiichiro Koda
DOI: https://doi.org/10.1063/1.2756356
IF: 4
2007-07-09
Applied Physics Letters
Abstract:Thin films of Bi(Fe1−xScx)O3 (BFSO) system were fabricated on (111)Pt∕TiO2∕SiO2∕(100)Si substrates by chemical solution deposition to improve the electrical resistivity by substituting electrically unstable Fe3+ cations for stable Sc3+ cations. A single phase of perovskite was obtained in the range of x=0–0.30, in which selective replacement of Fe3+ and Sc3+ was confirmed in x=0–0.15 by using Raman measurement. The leakage current density of the BFSO films was reduced by increasing x. A well-saturated polarization–electric field hysteresis loop was obtained for BFSO films with x=0.15, showing remanent polarization of approximately 35μC∕cm2.
physics, applied
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