Optical Constants of Er2O3-Al2O3 Films Studied by Spectroscopic Ellipsometry

Yanyan ZHU,Zebo FANG,Run XU
DOI: https://doi.org/10.1016/s1002-0721(10)60578-9
IF: 4.632
2011-01-01
Journal of Rare Earths
Abstract:Er2O3-Al2O3 film was deposited on the Si(001) substrate by radio frequency magnetron technique at room temperature. The sample was annealed at 450, 600 and 750 °C for 30 min in O2 ambience, respectively. The optical constants were studied by spectroscopic ellipsometry for both the as-deposited and the annealed samples. The proper values of refractive index indicated that it could be a useful material for solar cells.
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