Study on the Energy Structure of Amorphous Antireflection Er2o3 Films on Si(001) Substrates

Yan-Yan Zhu,Ze-Bo Fang,Ting Ji,Yong-Sheng Liu
DOI: https://doi.org/10.4028/www.scientific.net/msf.663-665.612
2010-01-01
Abstract:Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron technique. X-ray photoelectron spectroscopy, x-ray diffraction and atomic force microscopy show the Er2O3 films obtained are stoichiometric, amorphous, and uniform. The electronic structure is studied which shows a large energy gap value of the Er2O3 film, indicating Er2O3 film could be a promising antireflection coating for solar cells.
What problem does this paper attempt to address?