Surface and Interface of Er2O3 Films Epitaxially Grown on Si Substrate:An X-Ray Photoelectron Spectroscopy Study

Yanyan Zhu,Zebo Fang
DOI: https://doi.org/10.13922/j.cnki.cjovst.2008.06.007
2008-01-01
Abstract:The Er2O3 films were grown by molecular beam expitaxy(MBE) on p-type Si(001) and Si(111) substrates.The microstructures and stoichiometries of the films,before and after cleaning with argon ion sputtering,were characterized with x-ray photoelectron spectroscopy(XPS).No chemical reaction induced by X-ray irradiation or by Ar ion sputtering was observed.The preliminary results show that the silicon oxide coverage on Si substrates strongly affects the stoichiometries of the Er2O3 films.For instance,a SiOx layer was found to be on top of the Er2O3 films grown on oxidized Si(001) substrate;in contrast,no such SiOx layer exists on Er2O3 films grown on clean Si substrates.Possible mechanisms were also tentatively discussed.
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