Optical Constants of Al-Doped Er2o3 Films Prepared by Radio Frequency Reactive Magnetron Sputtering

Yan-Yan Zhu,Ze-Bo Fang
DOI: https://doi.org/10.4028/www.scientific.net/msf.663-665.361
2010-01-01
Materials Science Forum
Abstract:Al doped Er2O3 films were deposited on Si(001) substrates by radio frequency magnetron technique. X-ray diffraction and atomic force microscopy show the Al doped Er2O3 films obtained are amorphous and uniform. The optical constants are studied which shows a proper value of refractive index and a lower reflectivity, indicating it could be a usefully material for solar cells.
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