In Situ Optical Characterizations of the Annealing Effects Upon Sno2: F Films by Spectroscopic Ellipsometry

Guangzhong Yuan,Kangkai Wang,Ming Li,Qian Gao,Yong Liu,Shaohui Jia,Chenlu Song,Gaorong Han
DOI: https://doi.org/10.1088/2053-1591/3/10/105048
IF: 2.025
2016-01-01
Materials Research Express
Abstract:In situ study of the annealing effects, up to 600 degrees C, upon the optical performance of SnO2: F films have been successfully conducted with spectroscopic ellipsometry. The thickness and optical parameters were obtained by the regression of the measured ellipsometry parameters using a five-layer model. The results show that the re-densification of the SnO2: F layers occurs at above 200 degrees C, resulting in an irreversible thickness reducing from about 326 nm to about 321 nm. The refractive index of the SnO2: F layer increases with temperature and decreases in the cooling period. The in situ temperature dependence of the average refractive index has a good agreement with the sheet resistance measurement results, not only verifying the annealing process deteriorates the low-emissivity performance, but also demonstrates that spectroscopic ellipsometry method is a suitable optical characterization technique to adjust the on-line coating process of float glass.
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