Correlation Of Efficient Luminescence With Crystal Structures Of Y-Er2si2o7 And Alpha-Er2si2o7 In Er-Doped Silicon Oxide Films

Yuhan Gao,Qianyu Fu,Hao Shen,Dongsheng Li,Deren Yang
DOI: https://doi.org/10.1007/s10853-019-03783-3
IF: 4.5
2019-01-01
Journal of Materials Science
Abstract:We have investigated the fabrication and luminescent properties of different polymorphs of erbium (Er) silicate in Er-doped silicon oxide films. Silicon oxide films embedded with y-Er2Si2O7 and alpha-Er2Si2O7 layers have been fabricated with annealing at 1100 degrees C and 1150 degrees C, respectively. We demonstrate that y-Er2Si2O7 shows a stronger photoluminescence (PL) intensity, a longer PL lifetime, and a weaker PL thermal quenching effect than alpha-Er2Si2O7 due to the larger density of optically active Er ions, larger Er-Er average distance, higher symmetry, and stronger Er-O bonding. The Er lifetime-density product of y-Er2Si2O7 is as high as 3.5x10(18)scm(-3) and is at least 2.4 times as large as that of alpha-Er2Si2O7 making y-Er2Si2O7 an excellent candidate for high optical gain.
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