Abstract:The research on design for testability and reliability of security-aware hardware has been important in both academia and industry. With ever-growing globalization, commercial hardware design, manufacturing, transportation, and supply now involve many different countries, resulting in aggravated vulnerability from hardware design to manufacturing. Hardware with malicious purposes implanted from the third-party manufacturing process may control the operation of a circuit and tamper its functions, causing serious security issues. However, hardware includes not only devices and circuits but also systems. An important fact is that testability, reliability, and security technologies come from different design layers, but the impact evaluation is conducted at the system level. In other words, the testability, reliability, and security design of different layers can be carried out in a holistic manner to achieve optimization for the whole system. In addition, the testability, reliability, and security design technologies of each design layer can be collaboratively conducted to achieve better performance. The testability, reliability, and security tradeoff has garnered attention from academia and industry, particularly in the Post-Moore Era, due to the complexities and opportunities arising from new architectures and technologies.

An Overview of Design Methodology and Design for Testability for SOC's

A Test Architecture for Test Reuse in SOC Design

Challenges for Progress in Test and Design for Testability

SOC Design and Test

Design for Testability for System-on-Chip

Accelerating RTL Quality Assessment Method Based on CAD Tools

Design of the Power Management Module Integrated in SOC

Research of Design-on-Testability for SoC

Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware

SOC Testing Methodology and Practice

A JTAG Standard-based Test Circuit Design for SOC System

DFT Strategy of SOC

SOC Testing Based on Reuse

An improved method for test chip design

Design for Testability and Power Optimization in SOC

Testing Methodologies for Embedded Systems and Systems-on-Chip

Design for Test of Digital System Based on Function and Structure

Design and Implement for Test in a Complex System on Chip

Design-for-Testability and Test of Garfield Series SoC’s

A SOC Test Circuit Design and Implement Based on JTAG

To Discuss the BIST in SOC Test