SOC Testing Based on Reuse

王红,邢建辉,杨士元

DOI: https://doi.org/10.3969/j.issn.1003-353x.2004.05.015

2004-01-01

Abstract:SOC is increasingly designed by embedding reusable cores. A reuse-based teststrategy for such ICs is often attractive and sometimes even mandatory. Main kinds of SOC teststrategies are analyzed and surveyed from the reuse point. Finally, we discuss the issues remain tobe resolved.

What problem does this paper attempt to address?

A Test Architecture for Test Reuse in SOC Design

王超,沈海斌,陆思安,严晓浪

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.025

2004-01-01

Abstract:A chip test architecture implementing IP core test reuse in SOC design generally includes two parts: 1) a test access mechanism (TAM), which transmits test stimulus and response, and 2) a chip test controller, which realizes test control. A chip test architecture based on test bus is analyzed in the paper, and test scheduling in SOC is explained. Finally, the design of the chip test controller is presented, which is capable of carrying out test scheduling.
Reuse-Based SOC Test Integration and IEEE P1500 Standard

WU Chao,WANG Hong,YANG Shi-yuan

DOI: https://doi.org/10.3969/j.issn.1004-3365.2005.03.005

IF: 1.992

2005-01-01

Microelectronics Journal

Abstract:The reuse-based test strategy is an efficient approach to SOC test.IEEE P1500 is a standard under development, which aims at improving ease of test reuse and test integration with respect to the core-based SOC. The outline of P1500 and its current situation are described, with emphasis on the embedded core test architecture and the intention of P1500 standardization. The two compliance levels defined by P1500 are also sketched.
A System Verification Environment for Mixed-Signal SOC Design Based on IP Bus

YH Zhang,LN He,ZH Xu,XL Yan,LY Wang

DOI: https://doi.org/10.1109/icasic.2003.1277542

2003-01-01

Abstract:A reusable SoC verification environment is presented in this paper. This versatile environment, which is based on VSI Alliance IP bus standard, is in accordance with pervasive rules of IP reusing, and hence is suitable for varieties of designs. Through collaborating with other EDA tools, the environment has powerful capability to support HW/SW co-simulation and digital/analog co-simulation. To be user friendly, the environment is well organized to accommodate new IPs easily. It is configurable for verifications from system-level prototyping to gate level simulation. This environment works well for verifications of digital, analog and mixed-signal SoC designs.
An XML Schema based fine-grained SoC reuse methodology

孟昕,沈海斌,严晓浪

DOI: https://doi.org/10.3785/j.issn.1008-973X.2011.03.015

2011-01-01

Abstract:Traditional module based reuse methodology for SoC design has low efficiency and high iterationcost when faced with reuse of structure and abstract contents. This work proposed a fine-grained reusable design methodology based on XML schema(FGRX) as an extension to traditional methodology. Smaller logic blocks, code snippets and abstract contents are abstracted as reusable objects through analysis of existingdesign, which can be further used to construct a primitive set. Inter-dependencies between abstract reusable objects are organized in reusing rules set. Primitive set and reusing rule set are formally defined using XML schema. Similar designs are described at primitive level in XML format, which is statically validated by a checker that is automatically generated by XML validator according to the defined XML schema. Translation rules are defined in XSLT to translate primitive design description into other standard design file formats. Detailed semantic checks are implemented in XSLT to thoroughly validate design. FGRX and its application were discussed in detail via a case study. FGRX was used in several chip development projects and proven helpful to maximize the reuse of existing design, simplify the development of similar module or chips in same product line, get significant code reduction, and improve team efficiency.
Challenges for Progress in Test and Design for Testability

张永光,徐元欣,王匡

DOI: https://doi.org/10.3969/j.issn.1003-353x.2005.02.011

2005-01-01

Abstract:CMOS device dimensions scale down to the very deep submicrometer. ICs are going towards higher density, higher speed and lower power dissipation, making new challenges on IC test and design for test. The idea of test and design for testability is discussed, the challenges of test and design for testability are analyzed, then the test and design for testability in SOC design are discussed. The progresses in test and design for testability are put forward.
Design for Testability for System-on-Chip

王永生,肖立伊,毛志刚,叶以正

DOI: https://doi.org/10.3321/j.issn:0253-374x.2002.10.025

2002-01-01

Abstract:The system-on-chip(SoC)based on reusable embedded IP(intellectual property)poses new challenges for test,and the new test methodology and strategy for SoC are needed.Several main current design-for-testability (DFT)techniques for SoC are described along with their features,advantages and disadvantages.The IEEE P1500 and VSIA(virtual socket interface alliance)test access architecture schemes for SoC in the international industry are discussed.
SOC Testing Methodology and Practice

Cheng-Wen Wu

DOI: https://doi.org/10.48550/arXiv.0710.4669

2007-10-25

Hardware Architecture

Abstract:On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction, timing of functional test, scan IO sharing, embedded memory built-in self-test (BIST), etc. The chip has been fabricated and tested successfully by our approach. Test results justify that short test integration cost, short test time, and small area overhead can be achieved. To support SOC testing, a memory BIST compiler and an SOC testing integration system have been developed.
An Overview of Design Methodology and Design for Testability for SOC's

陆盘峰,魏少军

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.005

2004-01-01

Abstract:With the development of microelectronics technology and design techniques, system-on-a-chip (SOC) is becoming one of the main solutions to handle the increasing complexity of IC design. Latest development of the design methodology and design for testability for SOC's are reviewed. Problems to be solved in testing SOC's are discussed,and different structures and strategies for SOC test are described. Finally, the development trend of SOC design methodology and design for testability are predicted.
SOC Design and Test

谈颖莉,戎蒙恬

DOI: https://doi.org/10.3969/j.issn.1003-353x.2004.06.020

2004-01-01

Abstract:SOC (system-on-chip) products are more popular in nowadays. With the developmentof SOC design, SOC test becomes more and more complex. For high volume products, modern SOCdesign should take more consideration on design-for-test and design-for-manufacturability. Wepresent a case study of an SOC on design, test, and manufacturability, and carry out some ideas onSOC design and testing.
A Microprocessor Based SOC Built-In Test Scheme

XING Jian-hui,WANG Hong,YANG Shi-yuan,NIU Dao-heng

DOI: https://doi.org/10.3969/j.issn.1004-3365.2006.05.036

2006-01-01

Abstract:A microprocessor based builtin test scheme for SOC is proposed,which employs transparency path test access mechanism.In this scheme,an on-chip microprocessor is used as test source/sink to apply test vectors and collect responds,respectively.Transparency path is constructed to transfer test data between test source/sink and cores under test,and an embedded program is employed to manipulate the test process.Using this scheme,test application speed is increased,at-speed test can be obtained and the dependency on external automatic test equipment is reduced,while area overhead for extra hardware is acceptable.The experimental results show effectiveness of this scheme.
Test wrapper design for IP-core test reuse

陆思安,严晓浪,李浩亮,沈海斌,何乐年

DOI: https://doi.org/10.3785/j.issn.1008-973X.2004.01.019

2004-01-01

Abstract:An improved wrapper cell was presented based on analysis of two kinds of wrapper cells. It adds a mux to the traditional P1500 wrapper cell, which can test the data path of wrapper cells, resolve the problem of safe shifting of scan chains during shifting and reduces the dynamic test power during scan shifting. A kind of wrapper, namely a tri-state wrapper, was put forward based on analysis of two kinds of wrappers; IEEE P1500 wrapper and Philip TestShell. The architecture allows different cores to be connected directly to the same test bus.
System-on-Chip: Reuse and Integration

R. Saleh,S. Wilton,S. Mirabbasi,A. Hu,M. Greenstreet,G. Lemieux,P.P. Pande,C. Grecu,A. Ivanov

DOI: https://doi.org/10.1109/jproc.2006.873611

IF: 20.6

2006-06-01

Proceedings of the IEEE

Abstract:Over the past ten years, as integrated circuits became increasingly more complex and expensive, the industry began to embrace new design and reuse methodologies that are collectively referred to as system-on-chip (SoC) design. In this paper, we focus on the reuse and integration issues encountered in this paradigm shift. The reusable components, called intellectual property (IP) blocks or cores, are typically synthesizable register-transfer level (RTL) designs (often called soft cores) or layout level designs (often called hard cores). The concept of reuse can be carried out at the block, platform, or chip levels, and involves making the IP sufficiently general, configurable, or programmable, for use in a wide range of applications. The IP integration issues include connecting the computational units to the communication medium, which is moving from ad hoc bus-based approaches toward structured network-on-chip (NoC) architectures. Design-for-test methodologies are also described, along with verification issues that must be addressed when integrating reusable components.

engineering, electrical & electronic
Software- Based Self-Testing Methodology for Embedded Processor Cores

DING-Tao,Hong-he TAN,Yi-he SUN

DOI: https://doi.org/10.3969/j.issn.1002-2279.2011.04.004

2011-01-01

Microprocessors

Abstract:In contrast with stronger ASIC function and cheaper production cost,test cost is on the increase.Traditional test technique doesn't meet the test request of high speed and multi clock SOC.It is inevitable to develop new test technique and reduce test cost.This paper presents a Soft-Based Self-Testing(SBST) method,it uses the embedded processor core of the Device-Under-Test(DUT),completes the self diagnose of chip by executing test program.This method can apply at-speed test while alleviating the need for high-speed testers.It can be applied in test process for low resolution fault location.Finally,the SBST method demonstrates successful application to an audio SOC.
A JTAG Standard-based Test Circuit Design for SOC System

虞志益,雷健飞,李文宏,章倩苓

DOI: https://doi.org/10.3969/j.issn.1000-3819.2003.01.013

2003-01-01

Abstract:Along with the more complicated integrated circuit system and the emergence of IP-based SOC system, the test of IC system becomes more difficult and faces new challenge. In this paper we design a JTAG-based test circuit design after studying some important kinds of test techniques. It embraces some different test techniques at the little cost of the circuit complexity and overcomes some difficult issues in the test of IP-bases SOC system. We also give the test strategy based on this circuit.
Research on Test Scheduling for SoC Embedded IP Cores Based on Reuse of Network-on-chip

赵建武,师奕兵,王志刚

DOI: https://doi.org/10.3778/j.issn.1002-8331.2010.15.019

2010-01-01

Abstract:One of the main problems for the test of an SoC is the test scheduling.In the paper,a test scheduling method of NoC-based SoC is used to minimize test time while addressing resource conflicts between shared test resources and power dissipation constraints.Both the routing algorithm and the test access chains optimal algorithm are developed to support the test scheduling.A 2D mesh topological NoC is described by using VHDL while being implemented in FPGA.The NoC test platform is developed to analyze the NoC performance parameters,routing algorithm and switching algorithm.Finally,The experimental results from NoC test platform are analyzed.
SOC test architecture design for efficient utilization of test bandwidth

Sandeep Kumar Goel,Erik Jan Marinissen

DOI: https://doi.org/10.1145/944027.944029

IF: 1.447

2003-10-01

ACM Transactions on Design Automation of Electronic Systems

Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

computer science, software engineering, hardware & architecture
A SOC Test Circuit Design and Implement Based on JTAG

Guoqiang Bai

2009-01-01

Abstract:In this paper,a new test method was presented.This method was based on JTAG protocol.The JTAG instructions were extended and the extended test instructions can be download to SOC through JTAG.The test results can be also feedback through JTAG.The IP and memory in SOC design can be well tested.The test process can be configured flexibly,and the problem occurred in test can be fixed rapidly.
To Discuss the BIST in SOC Test

王新安,吉利久

DOI: https://doi.org/10.19304/j.cnki.issn1000-7180.2003.10.013

2003-01-01

Abstract:The advantage of BIST in SOC test is described in this paper.Combined with the standards of SOC design and test,we discussed the BIST in the future.
Effective Design Method to Reduce SCAN Test Application Time of SOC's

SHI Yi-xin,LI Wei,YU Jun,CHENG Jun-xia

DOI: https://doi.org/10.3969/j.issn.1004-3365.2007.05.035

2007-01-01

Abstract:The large size of the scan test data volume has become a significant factor in the overall production costs of IC's,due to the long test application time.In order to reduce the cost for large-scale SOC test,a DFT method to reuse the scan chain was proposed to reduce the scan shift time.Tests were conducted using the new method,and results were compared with those using the traditional method.It has been shown that the proposed method can reduce the test application time of SOC's,while maintaining a relatively high test coverage rate.
Research on Reuse of Embedded Processor Core in SOC System

JIANG Zhi-di,YAO Qing-dong,YU Guo-jun,WANG Wei-dong,LIU Peng,LAI Li-ya,Cai Zhong

DOI: https://doi.org/10.3969/j.issn.1001-7119.2006.03.024

2006-01-01

Abstract:With the development of the IC technique,SOC becomes popular as its low dispersion,low cost and high performance.The extension of media instruction on the general processor make the real-time multimedia processing algorithm based on processor possible.The reuse of multimedia processor IP core is the key and difficulty of programmable media SOC design.The paper studies the design of data paths and the communication mechanism of control information,focusing on the reuse of media processor IP core in media SOC.Finally,a multimedia SOC chip with typical multiprocessor architecture is shown developed by our R&D.

SOC Testing Based on Reuse

A Test Architecture for Test Reuse in SOC Design

Reuse-Based SOC Test Integration and IEEE P1500 Standard

A System Verification Environment for Mixed-Signal SOC Design Based on IP Bus

An XML Schema based fine-grained SoC reuse methodology

Challenges for Progress in Test and Design for Testability

Design for Testability for System-on-Chip

SOC Testing Methodology and Practice

An Overview of Design Methodology and Design for Testability for SOC's

SOC Design and Test

A Microprocessor Based SOC Built-In Test Scheme

Test wrapper design for IP-core test reuse

System-on-Chip: Reuse and Integration

Software- Based Self-Testing Methodology for Embedded Processor Cores

A JTAG Standard-based Test Circuit Design for SOC System

Research on Test Scheduling for SoC Embedded IP Cores Based on Reuse of Network-on-chip

SOC test architecture design for efficient utilization of test bandwidth

A SOC Test Circuit Design and Implement Based on JTAG

To Discuss the BIST in SOC Test

Effective Design Method to Reduce SCAN Test Application Time of SOC's

Research on Reuse of Embedded Processor Core in SOC System