Abstract:The rapid development of IC manufacturing technology poses huge challenges to localize an electrical defect to a specific area on the IC.Either traditional or existing addressable design methods of test chip fail to fulfill the current requirements for fast and accurate defect localization.In this paper,we present an improved method for addressable test chip design.For electrical testing of test chip,four-terminal connection of each test structure and single NMOS transistor as switch are used to improve measurement accuracy,peripheral circuits design simplicity as well as area efficiency.For defect localization,only a small amount of pads are added and used together with switches to localize physical faults.This method is used in a 110nm CMOS technology and verified by the silicon results,which shows several real defects(metal open,etc) are localized to help determine the physical root causes and realize a rapid yield improvement.

A JTAG Standard-based Test Circuit Design for SOC System

A Test Architecture for Test Reuse in SOC Design

A SOC Test Circuit Design and Implement Based on JTAG

Accelerating RTL Quality Assessment Method Based on CAD Tools

Challenges for Progress in Test and Design for Testability

Design of the Power Management Module Integrated in SOC

Design and implementation of a PCB testing system

An Overview of Design Methodology and Design for Testability for SOC's

A novel on-chip debug system with quick all-registers scan chain based on JTAG

Circuits Design for Contactless Testing of Nano-Scale CMOS Devices and Circuits

An improved method for test chip design

An Overview of JTAG Technology: Development and Application

A Microprocessor Based SOC Built-In Test Scheme

SOC Testing Methodology and Practice

An SW-HW Co-Design Debug Interface for SOCs Based on JTAG

Design for HW/SW Co-Testing Based on FPGA

Effective Design Method to Reduce SCAN Test Application Time of SOC's

SOC Testing Based on Reuse

Hierarchical Timing-driven Layout Based on .25um Technology

Software- Based Self-Testing Methodology for Embedded Processor Cores

To Discuss the BIST in SOC Test