Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

A Microprocessor Based SOC Built-In Test Scheme

A Test Architecture for Test Reuse in SOC Design

SOC Testing Methodology and Practice

Software- Based Self-Testing Methodology for Embedded Processor Cores

Binary Programming-based Transparency Path Construction for SoC Test Access

An improved method for test chip design

A scalable test mechanism and its optimization for test access to embedded cores

A SOC Test Circuit Design and Implement Based on JTAG

Microcontroller Based Testing of Digital IP-Core

Testability Analysis for Transparency Paths Ready IP Cores in SoC

An Improved Test Access Mechanism Structure and Optimization Technique in System-on-chip

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

Concurrent Core Test for SOC Using Shared Test Set and Scan Chain Disable

An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories

SOC test architecture design for efficient utilization of test bandwidth

SOC Testing Based on Reuse

A JTAG Standard-based Test Circuit Design for SOC System

Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip

Implementation Method of SOC Concurrent Test Based on ATE

Joint testing scheme on mixed SoC

Reuse-Based SOC Test Integration and IEEE P1500 Standard