Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

Reuse-Based SOC Test Integration and IEEE P1500 Standard

A Test Architecture for Test Reuse in SOC Design

SOC Testing Based on Reuse

Test wrapper design for IP-core test reuse

A System Verification Environment for Mixed-Signal SOC Design Based on IP Bus

Challenges for Progress in Test and Design for Testability

SOC Testing Methodology and Practice

Testline: an Ieee P1500 Compatible Test Scheme for Soc Test

A Microprocessor Based SOC Built-In Test Scheme

An Overview of Design Methodology and Design for Testability for SOC's

The Construction of a Research Environment for SoC Test Integration

A scalable test mechanism and its optimization for test access to embedded cores

An improved method for test chip design

System-on-Chip: Reuse and Integration

Design for Testability and Power Optimization in SOC

To Discuss the BIST in SOC Test

A P1500-compliant Wrapper and TAM Controller Co-Design Scheme

Concurrent Core Test for SOC Using Shared Test Set and Scan Chain Disable

A SOC Test Circuit Design and Implement Based on JTAG

SOC test architecture design for efficient utilization of test bandwidth

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability