To Discuss the BIST in SOC Test

王新安,吉利久

DOI: https://doi.org/10.19304/j.cnki.issn1000-7180.2003.10.013

2003-01-01

Abstract:The advantage of BIST in SOC test is described in this paper.Combined with the standards of SOC design and test,we discussed the BIST in the future.

What problem does this paper attempt to address?

A Test Architecture for Test Reuse in SOC Design

王超,沈海斌,陆思安,严晓浪

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.025

2004-01-01

Abstract:A chip test architecture implementing IP core test reuse in SOC design generally includes two parts: 1) a test access mechanism (TAM), which transmits test stimulus and response, and 2) a chip test controller, which realizes test control. A chip test architecture based on test bus is analyzed in the paper, and test scheduling in SOC is explained. Finally, the design of the chip test controller is presented, which is capable of carrying out test scheduling.
Challenges for Progress in Test and Design for Testability

张永光,徐元欣,王匡

DOI: https://doi.org/10.3969/j.issn.1003-353x.2005.02.011

2005-01-01

Abstract:CMOS device dimensions scale down to the very deep submicrometer. ICs are going towards higher density, higher speed and lower power dissipation, making new challenges on IC test and design for test. The idea of test and design for testability is discussed, the challenges of test and design for testability are analyzed, then the test and design for testability in SOC design are discussed. The progresses in test and design for testability are put forward.
SOC Testing Methodology and Practice

Cheng-Wen Wu

DOI: https://doi.org/10.48550/arXiv.0710.4669

2007-10-25

Hardware Architecture

Abstract:On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction, timing of functional test, scan IO sharing, embedded memory built-in self-test (BIST), etc. The chip has been fabricated and tested successfully by our approach. Test results justify that short test integration cost, short test time, and small area overhead can be achieved. To support SOC testing, a memory BIST compiler and an SOC testing integration system have been developed.
An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

XU Xin-min,HONG Bo,SHANG Li-na,HE Le-nian

DOI: https://doi.org/10.3969/j.issn.1007-0249.2007.06.019

2007-01-01

Abstract:A novel deterministic built-in self-test(BIST) scheme for barrel shifter embedded in 8 bits MCU datapath is proposed,and the validation is also provided.With this scheme,5 D-type registers are required and 16 patterns are generated during 16 test clock cycles,while the fault testing coverage can reach 100%.This scheme is also fit for DFT for general 2N(N≥4) bits barrel shifter.
An Overview of Design Methodology and Design for Testability for SOC's

陆盘峰,魏少军

DOI: https://doi.org/10.3969/j.issn.1004-3365.2004.03.005

2004-01-01

Abstract:With the development of microelectronics technology and design techniques, system-on-a-chip (SOC) is becoming one of the main solutions to handle the increasing complexity of IC design. Latest development of the design methodology and design for testability for SOC's are reviewed. Problems to be solved in testing SOC's are discussed,and different structures and strategies for SOC test are described. Finally, the development trend of SOC design methodology and design for testability are predicted.
A SOC Test Circuit Design and Implement Based on JTAG

Guoqiang Bai

2009-01-01

Abstract:In this paper,a new test method was presented.This method was based on JTAG protocol.The JTAG instructions were extended and the extended test instructions can be download to SOC through JTAG.The test results can be also feedback through JTAG.The IP and memory in SOC design can be well tested.The test process can be configured flexibly,and the problem occurred in test can be fixed rapidly.
A JTAG Standard-based Test Circuit Design for SOC System

虞志益,雷健飞,李文宏,章倩苓

DOI: https://doi.org/10.3969/j.issn.1000-3819.2003.01.013

2003-01-01

Abstract:Along with the more complicated integrated circuit system and the emergence of IP-based SOC system, the test of IC system becomes more difficult and faces new challenge. In this paper we design a JTAG-based test circuit design after studying some important kinds of test techniques. It embraces some different test techniques at the little cost of the circuit complexity and overcomes some difficult issues in the test of IP-bases SOC system. We also give the test strategy based on this circuit.
SOC Testing Based on Reuse

王红,邢建辉,杨士元

DOI: https://doi.org/10.3969/j.issn.1003-353x.2004.05.015

2004-01-01

Abstract:SOC is increasingly designed by embedding reusable cores. A reuse-based teststrategy for such ICs is often attractive and sometimes even mandatory. Main kinds of SOC teststrategies are analyzed and surveyed from the reuse point. Finally, we discuss the issues remain tobe resolved.
Implementation Method of SOC Concurrent Test Based on ATE

陶新萱

DOI: https://doi.org/10.3969/j.issn.1671-539X.2013.08.018

2013-01-01

Abstract:Concurrent test is a parallel test method,based on the individual hardware resources,with the multi-port characteristic of software,effective parallel test of different circuit is carried out.With the per-pin hardware architecture and test processor per digital channel,V9 3000 ATE fulfills the concurrent test needs.This article gives a study of the concurrent test of SOC based on V9 3000,especially the parallel test method of different frequency.With this method,the test time is reduced effectively compared to the serial test.
Reuse-Based SOC Test Integration and IEEE P1500 Standard

WU Chao,WANG Hong,YANG Shi-yuan

DOI: https://doi.org/10.3969/j.issn.1004-3365.2005.03.005

IF: 1.992

2005-01-01

Microelectronics Journal

Abstract:The reuse-based test strategy is an efficient approach to SOC test.IEEE P1500 is a standard under development, which aims at improving ease of test reuse and test integration with respect to the core-based SOC. The outline of P1500 and its current situation are described, with emphasis on the embedded core test architecture and the intention of P1500 standardization. The two compliance levels defined by P1500 are also sketched.
BIST Methodology, Architecture and Circuits for Pre-Bond TSV Testing in 3D Stacking IC Systems

Chao Wang,Jun Zhou,Roshan Weerasekera,Bin Zhao,Xin Liu,Philippe Royannez,Minkyu Je

DOI: https://doi.org/10.1109/TCSI.2014.2354752

2015-01-01

Abstract:This paper presents a built-in self test (BIST) methodology, architecture and circuits for testing Through Silicon Vias (TSVs) in 3D-IC systems prior to stacking in order to improve 3D-IC yield and reduce overall test cost. A scan switch network (SSN) architecture is proposed to perform pre-bond TSV scan testing in test mode, and operate as functional circuit in functional mode, respectively. In the SSN, novel test structures and circuits are proposed to address pre-bond TSV test accessibility issue and perform stuck-at-fault tests and TSV tests. By exploiting the inherent RC delay characteristics of TSV, a novel delay-based TSV test method is also proposed to map the variation of TSV-to-substrate resistance due to TSV defects to a test path delay change. Compared with state-of-art methods, the proposed BIST methodology addresses pre-bond TSV testing with a low-overhead integrated test solution which is compatible to existing 2D-IC testing method. The proposed BIST architecture and method can be implemented by standard DFT design flow and integrated into a unified pre-bond TSV test flow. Experiment results and robustness analysis are presented to verify the effectiveness of the proposed self-test methodology, architecture, and circuits.
Design of Phase Shifter for Logic BIST

梁骏,胡海波,张明

DOI: https://doi.org/10.3969/j.issn.1007-0249.2004.04.023

2004-01-01

Abstract:Logic Build In Self Test (BIST) will be widely used as an efficient Design For Test (DFT) tool in system on chip(SOC) technology. The high correlation of pseudo-random sequences produced by Linear Feedback Shift Register (LFSR) affects test coverage. Implementing phase shifter can reduce the correlation, which will improve test coverage of BIST. This paper introduces the mathematical theory of phase shifter and develops a new algorithm for design phase shifters with minimum cost of delay and speed.
BIST Technique Based on the Scan Forest Architecture

Ming-jing CHEN,Dong XIANG

DOI: https://doi.org/10.3969/j.issn.1007-130X.2005.04.013

2005-01-01

Abstract:In this paper, we propose an improved scan forest architecture which is suitable for scan-based Built-In Self-Test, in order to reduce the cost of scan testing to that of the non-scan design-for-testability method. Some techniques are adopted in constructing the improved scan forest architecture: a scan flip-flop regrouping strategy, a new scan tree architecture and a scan-in pin handling method. Sufficient experimental results show that the proposed BIST technique outperforms the conventional test-per-scan BIST architecture greatly by achieving better fault coverage, and that the improved scan forest architecture reduces the area overhead drastically compared with the original one ~([1]).
Hybrid BIST for system-on-a-chip using an embedded FPGA core

Gang Zeng,Hideo Ito

DOI: https://doi.org/10.1109/VTEST.2004.1299264

2004-01-01

Abstract:In this paper, a novel hybrid built-in self-test (BIST) approach for system-on-a-chip (SOC) test using an embedded FPGA core is presented. The hybrid BIST combining pseudorandom test with deterministic test can achieve not only complete fault coverage but also minimal test cost by selecting the appropriate number of pseudorandom patterns. Most importantly, the FPGA-based hybrid BIST has minimal hardware overhead, since after testing, the FPGA core can be reconfigured as normal mission logic. Experimental results for ISCAS 89 benchmarks and a platform FPGA chip have proven the efficiency of the proposed approach.
A Novel Bist Approach For Testing Dlls Of Soc

Min Wang,Zhiping Wen,Lei Chen,Yanlong Zhang,Zhiquan Zhang

DOI: https://doi.org/10.1109/CAS-ICTD.2009.4960759

2009-01-01

Abstract:A novel Built-In-Self-Test (BIST) approach is present in this paper to test the clock manager DLL of system-on-chip (SoC). The whole approach is divided into two steps. Firstly, test a single DLL which will be used as the benchmark in step two by introducing a test clock which is the jitter embodiment of the reference clock. The proposed method with a view to test the reference clock jitter tolerance. In the second step, the purpose is testing all the DLLs of SoC by traditional BIST approach based on comparison. And use the output response analyzer (ORA) to judge the comparison result. The proposed approach is widely suitable for test DLL of SoC rapidly and simply without complex test equipments.
A Novel BIST Approach for Testing Input/Output Buffers in SOCs

Lei Chen,Zhiping Wen,Zhiquan Zhang,Wang Min

DOI: https://doi.org/10.1109/CAS-ICTD.2009.4960760

2009-01-01

Abstract:A novel Built-in Self-Test (BIST) approach to test the configurable Input/Output buffers in Xilinx Virtex series SOCs using Hard Macro has been proposed in this paper. The proposed approach can completely detects single and multiple stuck-at gate-level faults as well as associated routing resources in I/O buffers. The proposed BIST architecture has been implemented and verified on Xilinx Virtex series FPGAs. Only total of 10 configurations are required to completely test the I/O buffers of Virtex devices.
SOC test architecture design for efficient utilization of test bandwidth

Sandeep Kumar Goel,Erik Jan Marinissen

DOI: https://doi.org/10.1145/944027.944029

IF: 1.447

2003-10-01

ACM Transactions on Design Automation of Electronic Systems

Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

computer science, software engineering, hardware & architecture
A Microprocessor Based SOC Built-In Test Scheme

XING Jian-hui,WANG Hong,YANG Shi-yuan,NIU Dao-heng

DOI: https://doi.org/10.3969/j.issn.1004-3365.2006.05.036

2006-01-01

Abstract:A microprocessor based builtin test scheme for SOC is proposed,which employs transparency path test access mechanism.In this scheme,an on-chip microprocessor is used as test source/sink to apply test vectors and collect responds,respectively.Transparency path is constructed to transfer test data between test source/sink and cores under test,and an embedded program is employed to manipulate the test process.Using this scheme,test application speed is increased,at-speed test can be obtained and the dependency on external automatic test equipment is reduced,while area overhead for extra hardware is acceptable.The experimental results show effectiveness of this scheme.
Scan-based BIST using an improved scan forest architecture

Dong Xiang,Ming-jing Chen,Kai-wei Li,Yu-liang Wu

DOI: https://doi.org/10.1109/ATS.2004.78

2004-01-01

Abstract:Scan forest is an efficient scan architecture which can reduce the test application cost, test power of scan testing and test data volume greatly. The scan forest is modified for scan-based BIST. Techniques are used to make the existing scan forest architecture to an improved scan forest that is more suitable for BIST. A scan flip-flop regrouping technique is introduced to make the scan flip-flop groups have similar sizes. Sufficient experimental results show that the proposed techniques improve the popular test-per-scan test architecture greatly on fault coverage and test length. It is shown according to the experimental results that test length is reduced 77.3% on average for all benchmark circuits.
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning

D Xiang,MJ Chen,JG Sun,H Fujiwara

DOI: https://doi.org/10.1109/ats.2003.1250773

2003-01-01

Abstract:The test effectiveness of a test-per-scan BIST scheme is highly dependent on the length and the number of the scan chains. Fewer cycles are adopted to capture test responses when the length of the scan chains increases. On the other hand, the number of test inputs should be increased when the number of the scan chains increases. Another important feature of the test-per-scan BIST scheme is that test responses of the circuit at the inputs of the scan flip-flops are unobservable during the shift cycles. A new scan architecture is proposed to make a scan-based circuit more observable. The scan chain is partitioned into multiple segments, according to which multiple capture cycles can be inserted to receive test responses during the shift cycles based on the test-per-scan test scheme. This scheme directly makes the circuit more observable and testable. Unlike other BIST schemes using multiple capture cycles after the shift cycles, our method inserts multiple capture cycles inside the shift cycles, but not after the shift cycles. Sufficient experimental results are presented to demonstrate the effectiveness of the method.

To Discuss the BIST in SOC Test

A Test Architecture for Test Reuse in SOC Design

Challenges for Progress in Test and Design for Testability

SOC Testing Methodology and Practice

An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

An Overview of Design Methodology and Design for Testability for SOC's

A SOC Test Circuit Design and Implement Based on JTAG

A JTAG Standard-based Test Circuit Design for SOC System

SOC Testing Based on Reuse

Implementation Method of SOC Concurrent Test Based on ATE

Reuse-Based SOC Test Integration and IEEE P1500 Standard

BIST Methodology, Architecture and Circuits for Pre-Bond TSV Testing in 3D Stacking IC Systems

Design of Phase Shifter for Logic BIST

BIST Technique Based on the Scan Forest Architecture

Hybrid BIST for system-on-a-chip using an embedded FPGA core

A Novel Bist Approach For Testing Dlls Of Soc

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

SOC test architecture design for efficient utilization of test bandwidth

A Microprocessor Based SOC Built-In Test Scheme

Scan-based BIST using an improved scan forest architecture

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning