Abstract:Test effectiveness of a test-per-scan built-in self-test (BIST) scheme is highly dependent on the length and number of scan chains. Fewer cycles are used to capture test responses when the length of the scan chains increases and the total number of clock cycles is fixed. Another important feature of the test-per-scan BIST scheme is that test responses of the circuit at the inputs of the scan flip-flops are not observable during the shift cycles. A new scan architecture is proposed to make a scan-based circuit more observable. The scan chain is partitioned into multiple segments. Multiple capture cycles are inserted to receive test responses during the shift cycles compared to the test-per-scan test scheme. Unlike other BIST schemes using multiple capture cycles after the shift cycles, our method inserts multiple capture cycles inside the shift cycles, but not after the shift cycles. Unlike the previous method that drives multiple scan segments by a single scan-in signal, the proposed method uses a new architecture to control all scan segments by different signals. Sufficient experimental results are presented to demonstrate the effectiveness of the method.

Scan-based BIST using an improved scan forest architecture

BIST Technique Based on the Scan Forest Architecture

Improving test effectiveness of scan-based BIST by scan chain partitioning

Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

Scan BIST with Biased Scan Test Signals

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST

Compressing Test Data for Deterministic BIST Using a Reconfigurable Scan Arhcitecture

A Reconfigurable Scan Architecture With Weighted Scan-Enable Signals for Deterministic BIST

Reduction of test power and data volume in BIST scheme based on scan slice overlapping

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

A scan chain optimization method for diagnosis

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding

An Novel Solution for Testing Power and Testing Time

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Low-power Technique of Scan-Based Design for Test

Conflict Driven Scan Chain Configuration for High Transition Fault Coverage and Low Test Power