Low-power Technique of Scan-Based Design for Test

L Xu,YH Sun,HY Chen

DOI: https://doi.org/10.1049/el:20001373

2000-01-01

Electronics Letters

Abstract:Details of an advanced scan tree structure for test power reduction, and the novel approach of rate of bit propagation which is used to estimate power consumption, are presented. Test power consumptions for advanced scan tree and traditional scan chains are compared.

What problem does this paper attempt to address?

A power-efficient scan tree design by exploring the Q'-D connection.

Linfeng Chen,Aijiao Cui

DOI: https://doi.org/10.1109/ISCAS.2013.6572022

2013-01-01

Abstract:Full scan design is usually time-consuming. Scan tree-based architectures can be applied to reduce test time, but few of them are power-efficient. Many low-power techniques have been proposed for scan chain design, while they are not applicable to scan tree architecture. To achieve a time-efficient and low-power scan design, in this paper, we propose a scheme to reduce the test power consumption of scan tree design by exploiting the Q' ports of scan flip-flops. As the structure of scan tree is not affected, the scheme resembles the time-efficiency of scan tree design. The modification for low power maintains the order of scan cells. It thus avoids the consequent design overhead due to scan reordering. Furthermore, no extra hardware is introduced. Experimental results on ISCAS'89 benchmarks show that 8.38% weighted transitions during test application can be reduced on average. © 2013 IEEE.
Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

Dong Xiang,Dianwei Hu,Qiang Xu,Alex Orailoglu

DOI: https://doi.org/10.1109/tcad.2009.2018775

IF: 2.9

2009-01-01

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Abstract:A new scan architecture is proposed to reduce peak test power and capture power. Only a subset of scan flip-flops are activated to shift test data or capture test responses in any clock cycle. This can effectively reduce the capture test power and peak test power. Two routing-driven schemes are proposed to reduce the routing overhead. Experimental results show that the proposed scan architecture can effectively reduce peak test power, capture power, test data volume, and test application cost.
A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

D Xiang,S Gu,JG Sun,YL Wu

DOI: https://doi.org/10.1109/dac.2003.1219118

2003-01-01

Abstract:A new scan architecture is proposed for full scan designed circuits. Scan flip-flops are grouped together if they do not have any common successors. This technique produces no new redundant faults. Scan flip-flops in the same group have the same values in all test vectors. All scan flip-flop groups form a scan forest, where each primary input drives the root of one scan tree. Test application time and test power based on the proposed scan forest architecture can be reduced drastically while pin overhead and delay overhead should be the same as that of conventional scan design. It is shown that test application cost and test power with the proposed scan forest architecture can be reduced to the level of nonscan design circuits.
A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

Aijiao Cui,Tingting Yu,Mengyang Li,Gang Qu

DOI: https://doi.org/10.1109/iscas.2015.7168711

2015-01-01

Abstract:Scan design is a good design-for-testability (DfT) discipline but always incurs high power dissipation during test application. Scan cell ordering is a simple yet effective scan path organization method to reduce the test power. In this paper, we propose a new scan chain ordering method based on two complementary scan cell connection styles. To minimize the transitions during the shifting of test data, we evaluate the connection cost between two scan cells based on the exact number of transitions caused by them during test instead of the Hamming distance between their test data. The test power can be minimized as it is proportional to the number of overall transitions. We applied our method on several benchmark circuits. The experimental results show that the scan designs by our method can always achieve the lower test power than those by other existing scan cell ordering methods.
A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

Zhou Jiang,Dong Xiang,Kele Shen

DOI: https://doi.org/10.1109/ATS.2015.9

2015-01-01

ats

Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.
A low power architecture based on unidirectional cut

Zhongwei Chen,Dong Xiang

DOI: https://doi.org/10.1149/1.3096457

2009-01-01

ECS Transactions

Abstract:Test power of a circuit mainly consists of capture power and shift power. In this paper, a new scan architecture is proposed to reduce both of them. In the architecture, a new graph algorithm is proposed to partition the scan flip-flops into two parts and then the ones with common successors in each part are grouped as a chain. By partitioning the scan flip-flops into two parts, the process of capture is cut into two sequential steps. This technique can effectively reduce the capture power. Using the clock disabling scheme, we can make sure that, only one or a small portion of scan chains are active during the shifting phase. Therefore, the peak power and average power are reduced. This architecture can effectively reduce the test time too. Experimental result shows that average power and peak power reduction are very significant, compared with the ordinary full-scan architecture. ©The Electrochemical Society.
Localizing Test Power Consumption for Scan Testing

XIANG Dong,向东,Kaiwei Li,kaiwei

2005-01-01

Abstract:A two stage scan architecture is proposed to do low power and low test application cost scan testing. The first stage includes multiple scan chains, where each scan chain is driven by a primary input. Each scan flip-flop in the multiple scan chains drives a group of scan flip-flops. The scan flip-flop in the multiple scan chain and the scan flip-flop driven by it are assigned the same values for all test vectors. Scan flip-flops in the multiple scan chains and those in the second stage use separate clock signals, but the design for testability technqiue needs only one clock. The proposed scan architecture localizes test power consumption to the multiple scan chains during test application. Test signals assigned to scan flip-flops in the multiple scan chains are applied to the scan flip-flops in the second stage after the test vector has been applied to the multiple scan chains. This technique can make test power consumption very small.
Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

Linfeng Chen,Aijiao Cui,Chip-Hong Chang

DOI: https://doi.org/10.1109/tc.2015.2401019

IF: 3.183

2015-01-01

IEEE Transactions on Computers

Abstract:Scan tree architecture has been proposed to reduce the test application time of full scan chain by placing multiple scan cells in parallel. Most existing techniques rely on non-compact test pattern sets to construct the scan tree. However, they produce inefficient scan tree when highly compact test sets with few don't cares are used. In this paper, the depth of the scan tree based on approximate compatibility relation for completely specified test data set is analyzed probabilistically by modeling its construction as a vertex coloring problem. The upper bound of edges-per-vertex is computed and demonstrated to be a prime factor that limits the efficiency of scan tree construction based on both compatible and approximately compatible test data between two flip-flops. Inverse compatibility and aggressive approximate compatibility are then proposed to increase the edges-per-vertex for vertex coloring. The Q'-SD connection between two adjacent scan cells is exploited to implement the inverse compatibility with no cost or timing impact. To maintain the fault coverage, the missing faults under the tree scan mode can be detected by switching the same base architecture into the linear scan mode with negligible hardware overhead as shown by the experimental results on ISCAS89, ISCAS99 and LGSynth93 benchmark circuits. On average, the scan tree generated by our method reduces the test time of the full scan chain by 56.65 percent, and that of the scan tree designed by the approximate compatibility method by 39.18 percent under the same compact test sets.
A Unified Solution to Scan Test Volume, Time, and Power Minimization

Zhen Chen,Sharad Seth,Dong Xiang,Bhargab B. Bhattacharya

DOI: https://doi.org/10.1109/vlsi.design.2010.44

2010-01-01

Abstract:The double-tree scan-path architecture, originally proposed for low test power, is adapted to simultaneously reduce the test application time and test data volume under external testing. Experimental results show significant performance improvements over other existing scan architectures.
An Improved Test Power Optimization Method by Insertion of Linear Functions

Lucheng He,Aijiao Cui,Mengyang Li,Andre Ivanov

DOI: https://doi.org/10.1109/iscas.2016.7539133

2016-01-01

Abstract:Scan-based design-for-testability (DFT) structure is widely used to facilitate the testing of integrated circuits (ICs). However, it always incurs much test power consumption. In this paper, we propose an improved test power optimization method by inserting extra logic in scan chain. It explores suitable places in scan chain based on an accurate criterion to insert different linear functions so as to minimize the transitions caused by shifting test data through scan chain. We apply our method on different benchmark circuits and the experimental result shows that the proposed method is more efficient to reduce test power than other optimization methods by inserting extra logic while incurring low area.
A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

Zhen Chen,Dong Xiang,Boxue Yin

DOI: https://doi.org/10.1145/1531542.1531659

2009-01-01

Abstract:In this paper, we propose a novel way to save test power, using the DFT based technique as basic method and post-generation filling as complementary. In this architecture, two methods of clustering flip-flops into scan chains are presented. One is clustering scan flip-flops into two parts to save capture power, and the other is clustering scan flip-flops of each part into scan chains to save shift power. By partitioning the scan flip-flops into two parts, the capture operation is cut into two sequential steps, which can effectively reduce the capture power. By partitioning flip-flops with common successors into one chain, we can make sure that, only one or a small part of scan chains are active during the shifting phase. For other scan chains, filling strategy is used as complementary method to further reduce test power. This architecture can effectively reduce the test time too. Experimental results show that average power reduction of 91.81% and average peak power reduction of 49.35% can be achieved, comparing to the ordinary full-scan architecture.
A scan chain optimization method for diagnosis

Huajun Chen,Zichu Qi,Lin Wang,Chao Xu

DOI: https://doi.org/10.1109/ICCD.2015.7357172

2015-01-01

Abstract:Scan chain structure consumes 10%~30% of die area, and most yield loss is caused by scan chain faults. This makes scan chain diagnosis be the key important method to ensure the high-quality products. The conventional scan chain diagnosis techniques usually conduct to a large range of suspect faulty flip flops. The failure analysis of those suspect faulty flip flops is time-consuming and costly. In this paper, we present a new scan chain construction method to reduce the range of suspect faulty flip flops. By constructing scan chains based on circuit logical structure, the proposed method can effectively improve the diagnosability of scan chains without any additional circuits. Moreover, by taking into consideration the physical location, the proposed method can decrease the negative effects of scan chains on the performance of designs. The proposed scan chain construction method can effectively handle a single scan chain fault as well as multiple scan chain faults. The experimental results show that the range of suspect faulty flip flops is reduced by 40%~90% on the most of ITC'99 benchmark circuits.
Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Z. Chen,J. Feng,D. Xiang,B. Yin

DOI: https://doi.org/10.1049/iet-cdt.2008.0163

2010-01-01

IET Computers & Digital Techniques

Abstract:Test power is a serious problem in the scan-based testing. DFT-based techniques and X-filling are two effective ways to reduce both shift power and capture power. However, few of the previous methods pay attention to the defect coverage when reducing the test power. Many of them, especially for X-filling methods, may lead to low defect coverage. In this paper, based on an effective scan chain configuration, we present a segment-based X-filling to reduce test power and keep the defect coverage. The scan chain configuration tries to cluster the scan flip-flops with common successors into one scan chain, in order to distribute the specified bits per pattern over a minimum number of chains. Based on the configuration, all the bits to some scan chains in a vector may be don't care(X). For these scan chains, segment-based X-filling is used to reduce test power and keep the defect coverage. Compared with the ordinary full-scan architecture, experimental results show that low test power and high defect coverage can be achieved.
Partition-based Low Power DFT Methodology for System-on-chips

LI Yu-fei,Jian Chen,FU Yu-zhuo,李宇飞,陈健,付宇卓

2007-01-01

Abstract:This paper presents a partition-based Design-for-Test (DFT) technique to reduce the power consumption during scan-based testing. This method is based on partitioning the chip into several independent scan domains. By enabling the scan domains alternatively, only a fraction of the entire chip will be active at the same time, leading to low power consumption during test. Therefore, it will significantly reduce the possibility of Electronic Migration and Overheating. In order to prevent the drop of fault coverage, wrappers on the boundaries between scan domains are employed. This paper also presents a detailed design flow based on Electronics Design Automation(EDA) tools from Synopsys to implement the proposed test structure. The proposed DFT method is experimented on a state-of-the-art System-on-chips (SOC). The simulation results show a significant reduction in both average and peak power dissipation without sacrificing the fault coverage and test time. This SOC has been taped out in TSMC and finished the final test in ADVANTEST.
Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Sungyoul Seo,Young-Woo Lee,Hyeonchan Lim,Sungho Kang

DOI: https://doi.org/10.1109/tsm.2020.2994182

IF: 2.7

2020-08-01

IEEE Transactions on Semiconductor Manufacturing

Abstract:With the rapidly increasing test time of semiconductor testing, the trend is currently toward improving test parallelism by exploiting multi-site testing. However, excessive test I/O channels and test power consumption lead to the degradation of multi-site testing efficiency owing to the limited number of tester I/Os and power capacity. In this paper, we present an advanced low pin count test architecture for efficient multi-site testing in semiconductors. To achieve this, the scan chain routing method is first exploited to reduce the power consumption during scan-based testing through a cluster-based approach, which is compatible with the test compression architecture. Subsequently, a new test compression architecture is proposed to encode test patterns and enable the testing of each device-under-test (DUT) through a low input test pin count by using the unique properties of the proposed tri-state detector and boundary scan architecture. The experimental results show the decrease in the test I/O requirements and test power consumption. Based on these improvements, the test application time (TAT) was significantly reduced for ISCAS'89 and IWLS'05 OpenCores benchmark circuits compared to the previous methods, without a heavy burden on the additional H/W area and routing overhead.

engineering, manufacturing, electrical & electronic,physics, condensed matter, applied
Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Dong Xiang,Zhen Chen

DOI: https://doi.org/10.1109/ATS.2011.74

2011-01-01

Abstract:A new test application scheme is proposed for low-power scan testing, which is able to compress test data significantly. A combination of a scan architecture and an existent test compression scheme can compress test data even better. Test power can be reduced greatly based on the new test application scheme, according to which only a subset of scan flip-flops shifts a test vector or captures test responses in any clock cycle. Test response data can be another important problem. A new test response compaction scheme called selective test response collection is proposed to reduce test response data. Selective test response collection combines with a structure-based test response compactor, according to which many test response data can be dropped. Experimental results show that the proposed test application scheme can efficiently reduce test power, compress test stimulus data, and compact test response data while test application cost can be well-controlled.
Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

Dong Xiang,Kai wei Li,Hideo Fujiwara

DOI: https://doi.org/10.1109/ATS.2005.46

2005-01-01

Abstract:A new scan architecture called reconfigured scan forest is proposed for cost-effective scan testing. Multiple scan flip-flops can be grouped based on structural analysis that avoids new unstable faults due to new reconvergent fanouts. The proposed new scan architecture makes all scan flip-flop groups have similar size because of flexibility of the scan flip-flop grouping scheme, where many scan flip-flops become internal scan flip-flops. The size of the exclusive-or trees can be reduced greatly compared with the original scan forest. Therefore, area overhead and routing complexity are reduced greatly. It is shown that test application cost and test power with the proposed scan forest architecture can be reduced to even less than 1% of the conventional full scan design with a single scan chain
An Effective Method To Reduce Test Power Dissipation

Yu Yang,Peng Xiyuan

2007-01-01

Abstract:In order to reduce test power for scan operation, a scan cell and test vector reordering algorithm and corresponding hardware architecture is proposed in this paper Experiments on ISCAS89 benchmark show that the proposed method is rather effective in reducing test power and the hardware overhead is reasonable acceptable.
An Novel Solution for Testing Power and Testing Time

L Xu,YH Sun,HY Chen

DOI: https://doi.org/10.1109/icasic.2001.982649

2001-01-01

Abstract:An advanced scan array architecture considering testing power reduction is proposed, in which a wrapper and two dimensional scan chain is adopted. Furthermore pseudo-BIST is integrated with the wrapper to cut down the testing time. Experimental results of industrial circuits show that testing power is reduced, observable and is close to the functional power. At the same time, testing time is also cut down deriving benefits from pseudo-BIST
Effective Design Method to Reduce SCAN Test Application Time of SOC's

SHI Yi-xin,LI Wei,YU Jun,CHENG Jun-xia

DOI: https://doi.org/10.3969/j.issn.1004-3365.2007.05.035

2007-01-01

Abstract:The large size of the scan test data volume has become a significant factor in the overall production costs of IC's,due to the long test application time.In order to reduce the cost for large-scale SOC test,a DFT method to reuse the scan chain was proposed to reduce the scan shift time.Tests were conducted using the new method,and results were compared with those using the traditional method.It has been shown that the proposed method can reduce the test application time of SOC's,while maintaining a relatively high test coverage rate.

Low-power Technique of Scan-Based Design for Test

A power-efficient scan tree design by exploring the Q'-D connection.

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A Cost-Effective Scan Architecture for Scan Testing with Nonscan Test Power and Test Application Cost

A Scan Design Method Based on Two Complementary Connection Styles to Minimize Test Power

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.

A low power architecture based on unidirectional cut

Localizing Test Power Consumption for Scan Testing

Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction

A Unified Solution to Scan Test Volume, Time, and Power Minimization

An Improved Test Power Optimization Method by Insertion of Linear Functions

A Power-Effective Scan Architecture Using Scan Flip-Flops Clustering And Post-Generation Filling

A scan chain optimization method for diagnosis

Scan Chain Configuration Based X-filling for Low Power and High Quality Testing.

Partition-based Low Power DFT Methodology for System-on-chips

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

An Effective Method To Reduce Test Power Dissipation

An Novel Solution for Testing Power and Testing Time

Effective Design Method to Reduce SCAN Test Application Time of SOC's